PREPARATION AND CHARACTERIZATION OF NICKEL FLUORIDE THIN-FILMS

被引：5

作者：

GEVERS, G ^{[1
]}

LACHTER, A ^{[1
]}

SALAGOITY, M ^{[1
]}

BARRIERE, AS ^{[1
]}

LOZANO, L ^{[1
]}

机构：

[1] CNRS,CHIM SOLIDE LAB,F-33405 TALENCE,FRANCE

来源：

关键词：

D O I：

10.1016/0022-0248(80)90058-5

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：45 / 52

页数：8

共 9 条

[1] 2P-3D CHARGE-TRANSFER IN TRANSITION-METAL OXIDES
BLAZEY, KW
[J]. PHYSICA B & C, 1977, 89 (APR): : 47 - 49
[2] JACOB M, 1978, VIDE S189, P1
[3] PREPARATION AND CHARACTERIZATION OF THIN FEF3 FILMS
LACHTER, A
LASCAUD, M
BARRIERE, AS
LOZANO, L
PORTIER, J
SABOYA, B
[J]. JOURNAL OF CRYSTAL GROWTH, 1978, 43 (05) : 621 - 627
[4] DIRECT AND TEMPERATURE-MODULATED REFLECTANCE SPECTRA OF MNO, COO, AND NIO
MESSICK, L
WALKER, WC
GLOSSER, R
[J]. PHYSICAL REVIEW B, 1972, 6 (10): : 3941 - &
[5] MOTT NF, 1971, ELECTRONIC PROCESSES
[6] OPTICAL PROPERTIES OF NICKEL OXIDE
NEWMAN, R
CHRENKO, RM
[J]. PHYSICAL REVIEW, 1959, 114 (06): : 1507 - 1513
[7] LOW-FREQUENCY CONDUCTIVITY DUE TO HOPPING PROCESSES IN SILICON
POLLAK, M
GEBALLE, TH
[J]. PHYSICAL REVIEW, 1961, 122 (06): : 1742 - &
[8] OPTICAL PROPERTIES OF NIO AND COO
POWELL, RJ
SPICER, WE
[J]. PHYSICAL REVIEW B-SOLID STATE, 1970, 2 (06): : 2182 - +
[9] SIMULTANEOUS OBSERVATION OF RUTHERFORD SCATTERING AND (ALPHA,X) REACTIONS IN ALF3 AND MGF2 LAYERS AND CORRELATION WITH THEIR ELECTRICAL PROPERTIES
SABOYA, B
CHEMIN, JF
ROTURIER, J
BARRIERE, A
DANTO, Y
SALARDENNE, J
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1975, 8 (09) : 1008 - 1020