NEW METHOD OF EVALUATION FOR X-RAY-FLUORESCENCE ANALYSIS .3. APPLICATION OF THE INTERNAL STANDARD

被引:6
作者
SUCHOMEL, J
UMLAND, F
机构
[1] UNIV MUNSTER,INST ANORGAN CHEM,D-4400 MUNSTER,FED REP GER
[2] DEGUSSA,D-6450 HANAU,FED REP GER
来源
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1981年 / 307卷 / 01期
关键词
D O I
10.1007/BF00493186
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
收藏
页码:14 / 18
页数:5
相关论文
共 11 条
[1]  
Bertin E. P., 1975, PRINCIPLES PRACTICE
[2]  
De Jongh W.K., 1973, STAINLESS STEEL XRAY, V2, P151, DOI 10.1002/xrs.1300020404
[3]  
MULLER RO, 1967, SPEKTROCHEMISCHE ANA
[4]   INHERENT ANALYSIS ERROR IN X-RAY SPECTROMETRY [J].
PLESCH, R .
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1976, 282 (05) :417-425
[5]  
RUSSELL BG, 1972, J S AFR CHEM I, V25, P297
[6]  
STRASHEIM A, 1964, APPL SPECTROSC, V18, P16
[7]   NEW METHOD OF EVALUATION FOR X-RAY-FLUORESCENCE ANALYSIS .1. PROBLEMS OF X-RAY-FLUORESCENCE ANALYSIS [J].
SUCHOMEL, J ;
UMLAND, F .
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1980, 300 (04) :257-262
[8]   NEW METHOD OF EVALUATION FOR X-RAY-FLUORESCENCE ANALYSIS .2. BACKGROUND AND LINE OVERLAPPING [J].
SUCHOMEL, J ;
UMLAND, F .
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1980, 300 (04) :263-266
[9]  
SUCHOMEL J, 1978, THESIS MUNSTER
[10]  
VONHEVESY G, 1935, CHEM ANAL XRAYS ITS