PARAFOCUSING PROPERTIES OF MICROCRYSTALLINE POWDER LAYERS IN X-RAY DIFFRACTION APPLIED TO THE DESIGN OF X-RAY GONIOMETERS

被引:22
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BRENTANO, JCM
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10.1063/1.1707733
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O59 [应用物理学];
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页码:420 / 434
页数:15
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共 38 条
[1]  
[Anonymous], 1942, XRAY CRYSTALLOGRAPHY
[2]  
BARRETT CS, 1944, REV SCI INSTRUM, V15, P13
[3]  
BERTHOLD R, 1934, Z TECHN PHYS, V15, P42
[4]  
Bohlin H, 1920, ANN PHYS-BERLIN, V61, P421
[5]  
BRADLEY, 1941, J SCI INSTR, V18, P216
[6]   A method for deducing accurate values of the lattice spacing from X- ray powder photographs taken by the Debye-Scherrer method [J].
Bradley, AJ ;
Jay, AH .
PROCEEDINGS OF THE PHYSICAL SOCIETY, 1932, 44 :563-579
[7]  
BRADLEY AJ, 1935, P PHYS SOC LOND, V47, P879
[8]  
Bragg WH, 1921, P PHYS SOC LOND, V33, P222
[9]  
Brentano J, 1925, P PHYS SOC LOND, V37, P184
[10]   For methodology for the quantitative measurement of the scattering of X-rays on microcrystalline layers. [J].
Brentano, J. .
ZEITSCHRIFT FUR PHYSIK, 1936, 99 (1-2) :65-72