X-RAY CHARACTERIZATION OF GRAPHITE-INTERCALATION COMPOUNDS

被引：29

作者：

LEUNG, SY

UNDERHILL, C

DRESSELHAUS, G

KRAPCHEV, T

OGILVIE, R

DRESSELHAUS, MS

机构：

[1] MIT,FRANCIS BITTER NATL MAGNET LAB,CAMBRIDGE,MA 02139

[2] MIT,CTR MAT SCI & ENGN,CAMBRIDGE,MA 02139

[3] MIT,DEPT MAT SCI,CAMBRIDGE,MA 02139

来源：

SOLID STATE COMMUNICATIONS | 1979年 / 32卷 / 08期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0038-1098(79)90717-8

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The understanding of electronic and lattice properties of graphite intercalation compounds depends critically on the model describing the structural properties. We report here results showing that well-staged as-grown samples do not exhibit the expected in-plane intercalant density, and that careful analysis of the 00ℓ x-ray diffractograms reveals important information on the in-plane occupation probability. © 1979.

引用

页码：635 / 639

页数：5

共 12 条

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