ATOMIC FORCE PROFILING BY UTILIZING CONTACT FORCES

被引：10

作者：

YANG, R

MILLER, R

BRYANT, PJ

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1988年 / 63卷 / 02期

关键词：

D O I：

10.1063/1.340089

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：570 / 572

页数：3

共 9 条

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[4]

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[7]

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[8] SQUEEZABLE ELECTRON-TUNNELING JUNCTIONS [J].

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[9] 3-DIMENSIONAL STYLUS PROFILOMETRY [J].

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