RELIABILITY-ANALYSIS OF 3-STATE SYSTEMS

被引：30

作者：

HATOYAMA, Y

机构：

[1] Tokyo Institute of Technology, Tokyo

来源：

IEEE TRANSACTIONS ON RELIABILITY | 1979年 / 28卷 / 05期

关键词：

3-State system; Reliability analysis; s-Association; s-Coherent system;

D O I：

10.1109/TR.1979.5220652

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper describes a reliability analysis of a system where its components take one of three states-good, degraded, or bad. For this 3-state system, the analogy of 2-state system is investigated. The calculation of system reliability can be reduced to that of the reliability of a corresponding 2-state system, provided that it is a generalized S-P system, with or without artificial, degraded components. Consequently, methods for evaluating the exact system reliability and useful bounds on system reliability of 2-state s-coherent system directly apply to 3-state systems. Some basic properties of system reliability with s-independent components are then presented. Further, some reliability bounds on systems with s-associated components are derived. Finally, the method is extended to multi-state systems. This state reduction can be used somewhat in analyzing models where time plays a role. Copyright © 1979 by the Institute of Electrical and Electronics Engineers, Inc.

引用

页码：386 / 393

页数：8