SECONDARY RELAXATION IN O-TERPHENYL GLASS

被引:77
作者
WU, L
NAGEL, SR
机构
[1] UNIV CHICAGO,DEPT PHYS,CHICAGO,IL 60637
[2] UNIV CHICAGO,JAMES FRANCK INST,CHICAGO,IL 60637
来源
PHYSICAL REVIEW B | 1992年 / 46卷 / 17期
关键词
D O I
10.1103/PhysRevB.46.11198
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have measured the dielectric response, epsilon(omega), in o-terphenyl due to the secondary relaxations that occur below the glass-transition temperature. We have found that the imaginary part of epsilon(omega) has a log-normal shape that can be ascribed to a Gaussian distribution of barrier heights. The width of this distribution increases slightly as the temperature is lowered. The peak position shifts in an Arrhenius manner with temperature as was reported previously by Johari and Goldstein. The data appear to be of different origin from what has also been called beta relaxation in mode-coupling theories and light-scattering experiments.
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页码:11198 / 11200
页数:3
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