CHARACTERIZATION OF A MONOLITHIC SLOT ANTENNA USING AN ELECTROOPTIC SAMPLING TECHNIQUE

被引：13

作者：

KAMOGAWA, KJ

TOYODA, I

NISHIKAWA, K

TOKUMITSU, T

机构：

[1] NTT Wireless Systems Laboratories, Kanagawa

来源：

IEEE MICROWAVE AND GUIDED WAVE LETTERS | 1994年 / 4卷 / 12期

关键词：

Electric network analysis - Electromagnetic field effects - Electrooptical effects - Impedance matching (electric) - Mathematical models - Monolithic integrated circuits - Sampling;

D O I：

10.1109/75.336231

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The first electro-optic measurement of a monolithic antenna near-field is presented. A 10-GHz monolithic slot antenna is designed and precisely characterized by Electro-Optic Sampling (EOS). The fringing effect of a shorted slot and the influence of undesirable modes on the antenna's near field can be measured accurately. Therefore, the EOS technique is very effective for onwafer measurement and the development of monolithic antennas.

引用

页码：414 / 416

页数：3

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