ANALYSIS OF MULTIPLE-SCATTERING XAFS DATA USING THEORETICAL STANDARDS

被引：745

作者：

NEWVILLE, M ^{[1
]}

RAVEL, B ^{[1
]}

HASKEL, D ^{[1
]}

REHR, JJ ^{[1
]}

STERN, EA ^{[1
]}

YACOBY, Y ^{[1
]}

机构：

[1] HEBREW UNIV JERUSALEM, RACAH INST PHYS, IL-91904 JERUSALEM, ISRAEL

来源：

PHYSICA B | 1995年 / 208卷 / 1-4期

关键词：

D O I：

10.1016/0921-4526(94)00655-F

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Theoretical standards for scattering amplitudes and phase shifts are often necessary for XAFS analysis, as for cases in which multiple scattering paths are important over the R-range of interest. Even when not necessary, they are often more convenient and reliable than experimental standards. We discuss several important considerations that must be taken into account to successfully compare ab initio theoretical calculations from FEFF to experimental XAFS spectra, and present a computer program, FEFFIT, to assist in using FEFF to get reliable information from experimental XAFS data.

引用

页码：154 / 156

页数：3

共 10 条

[1]

[Anonymous], 1969, DATA REDUCTION ERROR

[2]

BRILLOUIN L, 1962, SCI INFORMATION THEO

[3] APPLICATION OF THE RATIO METHOD OF EXAFS ANALYSIS TO DISORDERED-SYSTEMS [J].

BUNKER, G .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 207 (03) :437-444

[4]

HASKEL D, 1995, PHYSICA B, V209

[5]

HASKEL D, 1995, PHYSICA B, V208

[6]

NEWVIILLE M, IN PRESS

[7]

NEWVILLE M, 1995, PHYSICA B, V208

[8]

NEWVILLE M, 1995, PHYSICA B, V209

[9] THEORETICAL X-RAY ABSORPTION FINE-STRUCTURE STANDARDS [J].

REHR, JJ ;

DELEON, JM ;

ZABINSKY, SI ;

ALBERS, RC .

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1991, 113 (14) :5135-5140

[10] HIGH-ORDER MULTIPLE-SCATTERING CALCULATIONS OF X-RAY-ABSORPTION FINE-STRUCTURE [J].

REHR, JJ ;

ALBERS, RC ;

ZABINSKY, SI .

PHYSICAL REVIEW LETTERS, 1992, 69 (23) :3397-3400

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