MONO-ATOMIC TIPS FOR SCANNING TUNNELING MICROSCOPY

被引：248

作者：

FINK, HW

机构：

来源：

IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1986年 / 30卷 / 05期

关键词：

D O I：

10.1147/rd.305.0460

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：460 / 465

页数：6

共 9 条

[1]

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[2]

BINNIG G, 1982, HELV PHYS ACTA, V55, P726

[3]

Bowkett K. M., 1970, FIELD ION MICROSCOPY

[4] BINDING AND FIELD DESORPTION OF INDIVIDUAL TUNGSTEN ATOMS [J].

EHRLICH, G ;

KIRK, CF .

JOURNAL OF CHEMICAL PHYSICS, 1968, 48 (04) :1465-&

[5]

EHRLICH G, 1983, 9TH P INT VAC C 5TH, P3

[6] DIRECT IDENTIFICATION OF ATOMIC BINDING-SITES ON A CRYSTAL [J].

GRAHAM, WR ;

EHRLICH, G .

SURFACE SCIENCE, 1974, 45 (02) :530-552

[7] SHARPENING OF FIELD EMITTER TIPS BY ION SPUTTERING [J].

JANSSEN, AP ;

JONES, JP .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1971, 4 (01) :118-&

[8]

Mueller E.W., 1969, FIELD ION MICROSCOPY

[9]

MUELLER EW, 1974, PROGR SURFACE SCI, V4

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