SMALL-SPOT X-RAY-EMISSION SPECTROSCOPY AND ITS APPLICATION FOR STUDY OF ELECTRONIC-STRUCTURE AND CHEMICAL BONDING IN SOLIDS

被引:39
作者
KURMAEV, EZ
FEDORENKO, VV
SHAMIN, SN
POSTNIKOV, AV
WIECH, G
KIM, Y
机构
[1] UNIV MUNICH,SEKT PHYS,W-8000 MUNICH 22,GERMANY
[2] KOREA RES INST CHEM TECHNOL,DIV INORGAN MAT,TAEJON 305606,SOUTH KOREA
来源
PHYSICA SCRIPTA | 1992年 / T41卷
关键词
D O I
10.1088/0031-8949/1992/T41/052
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
A description is given of an X-ray emission spectrometer with high spatial (4-mu-m) and energy resolution (0.3-1.2eV) and of its application to the study of electronic structure of transition metal mono- and disilicides, carbon coatings, vanadium boride and silicon/silicon nitride systems. A comparison is made with other similar spectrometers, and the advantages of the method used are emphasized as being quite accurate, easy in interpretation and not destroying the samples, when studying electronic structure as a function of depth. For silicides, a comparison is made with results of band structure calculation of electronic structure.
引用
收藏
页码:288 / 292
页数:5
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