IMAGING OF N-TIO2 BY STM - ETCHING EFFECTS ON PHOTOELECTROCHEMISTRY AND SURFACE-STRUCTURE

被引：27

作者：

GILBERT, SE

KENNEDY, JH

机构：

[1] Univ of California, United States

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1988年 / 135卷 / 09期

关键词：

D O I：

10.1149/1.2096278

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

Titanium Oxides

引用

收藏

页码：2385 / 2386

页数：2

相关论文

共 9 条

[1] Finklea H. O., 1988, SEMICONDUCTOR ELECTR
[2] CORROSION SUPPRESSION ON RUTILE ANODES BY HIGH-ENERGY REDOX REACTIONS
HARRIS, LA
CROSS, DR
GERSTNER, ME
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (06) : 839 - 844
[3] THERMODYNAMIC AND PHOTO-ELECTROCHEMICAL BEHAVIOR OF THE NORMAL-TIO2 ELECTRODE IN FLUORIDE-CONTAINING SOLUTIONS
HEPEL, T
HEPEL, M
OSTERYOUNG, RA
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (09) : 2132 - 2141
[4] ITAYA K, COMMUNICATION
[5] THE APPLICATION OF SCANNING TUNNELING MICROSCOPY TO INSITU STUDIES OF NICKEL ELECTRODES UNDER POTENTIAL CONTROL
LEV, O
FAN, FR
BARD, AJ
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (03) : 783 - 784
[6] HIGH-RESOLUTION PHOTOELECTROCHEMICAL ETCHING OF NORMAL-GAAS WITH THE SCANNING ELECTROCHEMICAL AND TUNNELING MICROSCOPE
LIN, CW
FAN, FRF
BARD, AJ
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1987, 134 (04) : 1038 - 1039
[7] TUNNELING MICROSCOPY IN AN ELECTROCHEMICAL-CELL - IMAGES OF AG-PLATING
SONNENFELD, R
SCHARDT, BC
[J]. APPLIED PHYSICS LETTERS, 1986, 49 (18) : 1172 - 1174
[8] SONNENFELD R, 1987, APPL PHYS LETT, V50, P1747
[9] SCANNING TUNNELING MICROSCOPY OF ELECTROCHEMICALLY ACTIVATED PLATINUM SURFACES - A DIRECT EXSITU DETERMINATION OF THE ELECTRODE NANOTOPOGRAPHY
VAZQUEZ, L
GOMEZ, J
BARO, AM
GARCIA, N
MARCOS, ML
VELASCO, JG
VARA, JM
ARVIA, AJ
PRESA, J
GARCIA, A
AGUILAR, M
[J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1987, 109 (06) : 1730 - 1733