POWER SPECTRA OF SURFACE-ROUGHNESS OF LIGHT-EMITTING TUNNEL-JUNCTIONS MEASURED BY SCANNING TUNNELING MICROSCOPY

被引：11

作者：

TAKEUCHI, K ^{[1
]}

UEHARA, Y ^{[1
]}

USHIODA, S ^{[1
]}

MIKOSHIBA, N ^{[1
]}

MORITA, S ^{[1
]}

机构：

[1] IWATE UNIV,DEPT ELECT ENGN,MORIOKA,IWATE 020,JAPAN

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1990年 / 8卷 / 01期

关键词：

D O I：

10.1116/1.576387

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Using a scanning tunneling microscope (STM), we have measured the microscopic surface roughness of light emitting tunnel junctions (LETJ) which consist of thin films of Al, A1 oxide, and Au. The power spectrum of roughness obtained from the STM data was used to calculate the light emission spectrum, using a theory that takes into account the effect of surface roughness in first order perturbation. The calculated spectrum due to the term first order in roughness fits the measured emission spectrum very well, but when the term due to an unperturbed smooth surface is included, the fit becomes unsatisfactory. We conclude that the theory predicts a wrong ratio between the contribution from surface roughness and the contribution from a smooth surface. © 1990, American Vacuum Society. All rights reserved.

引用

页码：557 / 560

页数：4

共 11 条

[1] RAMAN-SCATTERING AND ATTENUATED-TOTAL-REFLECTION STUDIES OF SURFACE-PLASMON POLARITONS [J].