POSITRON TRAPPING AT VACANCIES IN ELECTRON-IRRADIATED SI AT LOW-TEMPERATURES

被引:112
作者
MAKINEN, J [1 ]
CORBEL, C [1 ]
HAUTOJARVI, P [1 ]
MOSER, P [1 ]
PIERRE, F [1 ]
机构
[1] CEN,DEPT RECH FONDAMENTALE,SERV PHYS,F-38041 GRENOBLE,FRANCE
来源
PHYSICAL REVIEW B | 1989年 / 39卷 / 14期
关键词
D O I
10.1103/PhysRevB.39.10162
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:10162 / 10173
页数:12
相关论文
共 64 条
[1]  
ABAKUMOV VN, 1978, SOV PHYS SEMICOND+, V12, P1
[2]  
[Anonymous], 1983, POSITRON SOLID STATE
[3]  
[Anonymous], POINT DEFECTS SEMICO
[4]  
BLAKEMORE JS, 1962, SEMICONDUCTOR STATIS
[5]   ELECTRON PARAMAGNETIC RESONANCE OF ALUMINUM INTERSTITIAL IN SILICON [J].
BROWER, KL .
PHYSICAL REVIEW B-SOLID STATE, 1970, 1 (05) :1908-&
[6]   VACANCY-DIFFUSION MODEL FOR QUENCHED-IN E-CENTERS IN CW-LASER ANNEALED VIRGIN SILICON [J].
CHANTRE, A ;
KECHOUANE, M ;
BOIS, D .
PHYSICA B & C, 1983, 116 (1-3) :547-552
[7]   POSITRON-ANNIHILATION SPECTROSCOPY OF NATIVE VACANCIES IN AS-GROWN GAAS [J].
CORBEL, C ;
STUCKY, M ;
HAUTOJARVI, P ;
SAARINEN, K ;
MOSER, P .
PHYSICAL REVIEW B, 1988, 38 (12) :8192-8208
[8]   TEMPERATURE-DEPENDENCE OF THE ANNIHILATION OF POSITRONS IN SI CONTAINING DIVACANCIES AND QUADRIVACANCIES [J].
DANNEFAER, S ;
KUPCA, S ;
HOGG, BG ;
KERR, DP .
PHYSICAL REVIEW B, 1980, 22 (12) :6135-6139
[9]   INFLUENCE OF DEFECTS AND TEMPERATURE ON ANNIHILATION OF POSITRONS IN NEUTRON-IRRADIATED SILICON [J].
DANNEFAER, S ;
DEAN, GW ;
KERR, DP ;
HOGG, BG .
PHYSICAL REVIEW B, 1976, 14 (07) :2709-2714
[10]   DEFECTS AND OXYGEN IN SILICON STUDIED BY POSITRONS [J].
DANNEFAER, S .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1987, 102 (02) :481-491