3-PHOTON SPECTROSCOPY ON THIN-FILMS

被引:3
作者
FROHLICH, D
KAUSCHALEK, J
NIESWAND, W
PAHLKE, C
机构
[1] Institut fur Physik, Universitat Dortmund
来源
PHYSICAL REVIEW B | 1992年 / 45卷 / 19期
关键词
D O I
10.1103/PhysRevB.45.11016
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Three-photon sum-frequency generation was used to excite resonances in the region of the 1S-exciton polariton in KI. The investigations were done on evaporated films of KI. There are significant differences in the line shape of the resonances as compared with measurements on bulk samples. For the description of the three-photon reflection and transmission spectra the Maxwell boundary conditions have to be taken into account. A detailed analysis of three-photon sum-frequency generation at normal incidence in thin films leads to formulas which describe quantitatively the experimental results.
引用
收藏
页码:11016 / 11021
页数:6
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