BUNDLE FORMATION OF POLYMERS WITH AN ATOMIC-FORCE MICROSCOPE IN CONTACT MODE - A FRICTION VERSUS PEELING PROCESS

Among near field microscopes, the atomic force microscope appears as a powerful and versatile tool for investigating local mechanical properties. In addition, we can take advantage of the tip sample interaction, to perturb, and in turn modify the surface of soft samples. Here we report an attempt to modify the structure of a substituted polyacetylene film spread on a surface. Regular periodic patterns are obtained, and we show that scan frequency and applied load are the pertinent parameters that control the period. These results can be described as bundle formation via a peeling process. © 1994 The American Physical Society.