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REFLECTION PROPERTIES OF MULTIMODE INTERFERENCE DEVICES

被引：43
作者：
PENNINGS, ECM
VANROIJEN, R
VANSTRALEN, MJN
DEWAARD, PJ
KOUMANS, RGMP
VERBEEK, BH
机构：
[1] PHILIPS OPTOELECTR CTR,5656 AA EINDHOVEN,NETHERLANDS
[2] DELFT UNIV TECHNOL,FAC ELECT ENGN,TELECOMMUN & REMOTE SENSING TECHNOL LAB,2600 GA DELFT,NETHERLANDS
[3] DELFT UNIV TECHNOL,FAC ELECT ENGN,ELECTROMAGNET RES LAB,2600 GA DELFT,NETHERLANDS
来源：
IEEE PHOTONICS TECHNOLOGY LETTERS | 1994年 / 6卷 / 06期
关键词：
D O I：
10.1109/68.300172
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We report on the reflection properties of multimode interference (MMI) devices: we distinguish between reflection back into the input waveguides and internal resonance modes due to the occurrence of simultaneous self-images. Because of self-imaging, reflection can be extremely efficient, even in the case of MMI devices with optimized transmission. This conclusion is confirmed hy the observed spectral behavior of InP-based ring lasers incorporating MMI 3dB couplers and MMI power splitters. Several techniques are proposed to minimize the influence of these reflections.
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页码：715 / 718
页数：4
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