MEASUREMENT OF PROPERTIES OF THIN FILMS ON CHROMIUM BY THE REFLECTION OF POLARIZED LIGHT

被引:9
作者
BATEMAN, JB
HARRIS, MW
机构
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D O I
10.1111/j.1749-6632.1951.tb48882.x
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
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页码:1064 / 1081
页数:18
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