TUNABLE LABORATORY EXTENDED X-RAY ABSORPTION FINE-STRUCTURE SYSTEM

[1] CHEMICAL-SHIFTS OF K X-RAY ABSORPTION-EDGE OF COPPER IN OXIDES [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1976, 37 (07) : 725 - 728

[2] THEORY OF EXTENDED X-RAY ABSORPTION-EDGE FINE-STRUCTURE (EXAFS) IN CRYSTALLINE SOLIDS [J]. PHYSICAL REVIEW B, 1975, 11 (04): : 1279 - 1288

[3] CORRECTION FOR NONLINEARITY IN X-RAY COUNTING SYSTEMS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1961, 32 (03) : 368 - &

[4] CAUCHOIS Y, 1975, ATOMIC INNER SHELL P, V2, pCH3

[5] EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE OF SURFACE ATOMS ON SINGLE-CRYSTAL SUBSTRATES - IODINE ADSORBED ON AG(111) [J]. PHYSICAL REVIEW LETTERS, 1978, 41 (05) : 309 - 312

[6] DELCUETO JA, 1978, J PHYS C SOLID STATE, V11, pL833, DOI 10.1088/0022-3719/11/20/003

[7] DELCUETO JA, 1978, J PHYS E, V11, P1

[8] HANSON LH, COMMUNICATION

[9] A novel, accurate-focusing X-ray spectrometer. [J]. ZEITSCHRIFT FUR PHYSIK, 1933, 82 (7-8): : 507 - 528

[10] KINCAID B, 1975, THESIS STANFORD U

[1] CHEMICAL-SHIFTS OF K X-RAY ABSORPTION-EDGE OF COPPER IN OXIDES [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1976, 37 (07) : 725 - 728

[2] THEORY OF EXTENDED X-RAY ABSORPTION-EDGE FINE-STRUCTURE (EXAFS) IN CRYSTALLINE SOLIDS [J]. PHYSICAL REVIEW B, 1975, 11 (04): : 1279 - 1288

[3] CORRECTION FOR NONLINEARITY IN X-RAY COUNTING SYSTEMS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1961, 32 (03) : 368 - &

[4] CAUCHOIS Y, 1975, ATOMIC INNER SHELL P, V2, pCH3

[5] EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE OF SURFACE ATOMS ON SINGLE-CRYSTAL SUBSTRATES - IODINE ADSORBED ON AG(111) [J]. PHYSICAL REVIEW LETTERS, 1978, 41 (05) : 309 - 312

[6] DELCUETO JA, 1978, J PHYS C SOLID STATE, V11, pL833, DOI 10.1088/0022-3719/11/20/003

[7] DELCUETO JA, 1978, J PHYS E, V11, P1

[8] HANSON LH, COMMUNICATION

[9] A novel, accurate-focusing X-ray spectrometer. [J]. ZEITSCHRIFT FUR PHYSIK, 1933, 82 (7-8): : 507 - 528

[10] KINCAID B, 1975, THESIS STANFORD U