RIETVELD ANALYSIS OF X-RAY-POWDER DIFFRACTION PATTERNS FOR THE NEW SMFE10MO2NX NITRIDE COMPOUND

被引：13

作者：

PSYCHARIS, V

ANAGNOSTOU, M

CHRISTIDES, C

NIARCHOS, D

机构：

[1] NSCR DEMOKRITOS, Institute of Materials Science

来源：

JOURNAL OF APPLIED PHYSICS | 1991年 / 70卷 / 10期

关键词：

D O I：

10.1063/1.350016

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Considerable improvement of the magnetic properties has been achieved by nitrogen absorption in the RFe10Mo2 compounds with ThMn12-type structure. A lattice expansion has been observed (a = 8.6781, c = 4.8531 angstrom for the nitride and a = 8.5869, c = 4.8002 angstrom for the nitrogen-free sample) from N2 absorption and a determination of the displaced Sm, Fe, and Mo positions has been achieved from Rietveld analysis for the SmFe10Mo2Nx compound. This structure determination provides some evidence for the site occupation of the nitrogen atoms in the tetragonal ThMn12-type structure. Measurements of an oriented powder sample at 295 K show that the easy magnetization direction is in the (a,b) plane.

引用

页码：6122 / 6124

页数：3