A NEW LINESHAPE FOR FITTING X-RAY PHOTOELECTRON PEAKS

被引：15

作者：

LOSEV, A

机构：

来源：

SURFACE AND INTERFACE ANALYSIS | 1989年 / 14卷 / 12期

关键词：

D O I：

10.1002/sia.740141207

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：845 / 849

页数：5

共 13 条

[1] APPLICATION OF FOURIER-TRANSFORM TECHNIQUES TO PROBLEM OF DECONVOLUTION IN PHOTOELECTRON-SPECTROSCOPY [J].

BEATHAM, N ;

ORCHARD, AF .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 9 (02) :129-148

[2] MANY-ELECTRON SINGULARITY IN X-RAY PHOTOEMISSION AND X-RAY LINE SPECTRA FROM METALS [J].

DONIACH, S ;

SUNJIC, M .

JOURNAL OF PHYSICS PART C SOLID STATE PHYSICS, 1970, 3 (02) :285-&

[3] CURVE FITTING XPS SPECTRA [J].

HUGHES, AE ;

SEXTON, BA .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1988, 46 (01) :31-42

[4] APPLICATION OF ASYMMETRICAL GAUSSIAN LORENTZIAN MIXED-FUNCTION FOR X-RAY PHOTOELECTRON CURVE SYNTHESIS [J].

KOJIMA, I ;

KURAHASHI, M .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1987, 42 (02) :177-181

[5] THE SCOPE AND LIMITATIONS OF CURVE FITTING [J].

MADDAMS, WF .

APPLIED SPECTROSCOPY, 1980, 34 (03) :245-267

[6] A NEW NON-LINEAR LEAST-SQUARE ALGORITHM FOR VOIGT SPECTRAL-LINES [J].

NOLL, RJ ;

PIRES, A .

APPLIED SPECTROSCOPY, 1980, 34 (03) :351-360

[7]

POCTOR A, 1984, APPL SPECTROSC, V38, P505

[8]

Sherwood P.M.A., 1983, PRACTICAL SURFACE AN, P445

[9] QUANTITATIVE-ANALYSIS OF THE INELASTIC BACKGROUND IN SURFACE ELECTRON-SPECTROSCOPY [J].

TOUGAARD, S .

SURFACE AND INTERFACE ANALYSIS, 1988, 11 (09) :453-472

[10]

WEIGHTMAN P, 1978, J PHYS C SOLID STATE, V8, P550

← 1 2 →