THE DETECTION OF AN ION-BEAM USING AN ELECTRON SATURATED LANGMUIR PROBE

被引：1

作者：

ARMSTRONG, R

机构：

来源：

INTERNATIONAL JOURNAL OF ELECTRONICS | 1980年 / 49卷 / 04期

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D O I：

10.1080/00207218008901184

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：339 / 342

页数：4

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