INTRINSIC OPTICAL-CONSTANTS OF ALUMINUM

被引：4

作者：

BODO, Z

GERGELY, G

机构：

来源：

APPLIED OPTICS | 1987年 / 26卷 / 11期

关键词：

D O I：

10.1364/AO.26.002065

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：2065 / 2067

页数：3

共 10 条

[1] ELECTRON-MICROSCOPIC AND ELLIPSOMETRIC STUDIES ON OXIDIZED ALUMINUM LAYERS [J].

BARNA, PB ;

BODO, Z ;

GERGELY, G ;

SZIGETHY, D ;

ADAM, J ;

JAKAB, P .

VACUUM, 1983, 33 (1-2) :93-97

[2] SPECTRAL ELLIPSOMETRIC TEM AND ELECTRON SPECTROSCOPIC INVESTIGATIONS ON OXIDIZED ALUMINUM THIN-FILMS [J].

BARNA, PB ;

BODO, Z ;

GERGELY, G ;

ADAM, J .

VACUUM, 1986, 36 (7-9) :465-469

[3]

BARNA PB, IN PRESS THICKNESS D

[4]

BARNA PB, 1981, THIN SOLID FILMS, V120, P249

[5]

BLANCO JR, 1985, APPL OPTICS, V24, P3773, DOI 10.1364/AO.24.003773

[6]

Croce P., 1981, Acta Electronica, V24, P247

[7] OPTICAL CONSTANTS AND REFLECTANCE AND TRANSMITTANCE OF EVAPORATED ALUMINUM IN VISIBLE AND ULTRAVIOLET [J].

HASS, G ;

WAYLONIS, JE .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1961, 51 (07) :719-&

[8]

SMITH DY, ANL8324DE84011428 RE

[9] EFFECT OF SURFACE-ROUGHNESS ON ELLIPSOMETRY OF ALUMINUM [J].

SMITH, T .

SURFACE SCIENCE, 1976, 56 (01) :252-271

[10]

STILES E, 1980, PHYS REV B, V22, P1612

← 1 →