AN INVESTIGATION OF THE SECONDARY-ELECTRON EMISSION OF CARBON SAMPLES EXPOSED TO A HYDROGEN PLASMA

被引：51

作者：

WOODS, ME ^{[1
]}

HOPKINS, BJ ^{[1
]}

MATTHEWS, GF ^{[1
]}

MCCRACKEN, GM ^{[1
]}

SEWELL, PM ^{[1
]}

FAHRANG, H ^{[1
]}

机构：

[1] UKAEA EURATOM FUS ASSOC,CULHAM LAB,ABINGDON OX14 3DB,OXON,ENGLAND

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1987年 / 20卷 / 09期

关键词：

D O I：

10.1088/0022-3727/20/9/008

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1136 / 1142

页数：7

共 14 条

[1]

ANDERSEN HH, 1981, TOP APPL PHYS, V47, P145, DOI [10.1007/3540105212_9, DOI 10.1007/3540105212_9]

[2] CONTAMINATION OF THE JET LIMITERS WITH METALS DURING THE DIFFERENT OPERATIONAL PHASES [J].

BEHRISCH, R ;

EHRENBERG, J ;

BERGSAKER, H ;

COAD, JP ;

DEKOCK, L ;

EMMOTH, B ;

KUKRAL, H ;

MARTINELLI, AP ;

MCCRACKEN, GM ;

PARTRIDGE, JW .

JOURNAL OF NUCLEAR MATERIALS, 1987, 145 :731-735

[3]

BRUINING H, 1954, PHYSICS APPLICATION

[4] ELECTRON-EMISSION FROM MOLYBDENUM UNDER ION-BOMBARDMENT [J].

FERRON, J ;

ALONSO, EV ;

BARAGIOLA, RA ;

OLIVAFLORIO, A .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1981, 14 (09) :1707-1719

[5]

Hammersley J.M., 1964, MONTE CARLO METHODS

[6] HEAT FLOW THROUGH A LANGMUIR SHEATH IN PRESENCE OF ELECTRON EMISSION [J].

HOBBS, GD ;

WESSON, JA .

PLASMA PHYSICS, 1967, 9 (01) :85-&

[7] THE DETERMINATION OF SHEATH POTENTIAL FROM RETARDING-FIELD ANALYZER MEASUREMENTS IN TOKAMAK EDGE PLASMAS [J].

MATTHEWS, GF ;

MCCRACKEN, GM ;

SEWELL, P ;

WOODS, M ;

HOPKINS, BJ .

JOURNAL OF NUCLEAR MATERIALS, 1987, 145 :225-230

[8]

MCCRACKEN GM, 1985, UNPUB

[9]

MOLLER W, 1986, PHYSICS PLASMA WALL, P351

[10] SECONDARY-ELECTRON YIELDS OF CARBON-COATED AND POLISHED STAINLESS-STEEL [J].

RUZIC, D ;

MOORE, R ;

MANOS, D ;

COHEN, S .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (04) :1313-1316

← 1 2 →