TIME AND TOTAL DOSE-RESPONSE OF NON-VOLATILE UVPROMS

被引：3

作者：

SAMPSON, DF

机构：

[1] Harris Gov Aerosp Syst Div,, Melbourne, FL, USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1988年 / 35卷 / 06期

关键词：

Aircraft--Electronic Equipment - Dosimetry - Gamma Rays - Statistical Methods;

D O I：

10.1109/23.25494

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The total-dose radiation response and intrinsic charge loss are reported as a function of operating time in a system. Five groups of Intel and Signetics 27C256 devices were aged from one to five years through accelerated bake to simulate system use. Characterizations of the groups with five years of simulated use are presented. The device margin voltage was characterized before and after aging and after exposure to five total-dose radiation levels (1K - 5K rads (Si)). A statistical model based upon the characterization data was developed to establish reprogramming intervals for these devices when they are used in airborne electronic systems.

引用

页码：1542 / 1546

页数：5