AN APPLICATION OF EELS IN THE EXAMINATION OF INCLUSIONS AND GRAIN-BOUNDARIES OF A SIC CERAMIC

被引：12

作者：

BOURDILLON, AJ ^{[1
]}

JEPPS, NW ^{[1
]}

STOBBS, WM ^{[1
]}

KRIVANEK, OL ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1981年 / 124卷 / OCT期

关键词：

D O I：

10.1111/j.1365-2818.1981.tb01304.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：49 / 56

页数：8

共 34 条

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