ELECTRON BACKSCATTERING PATTERNS - NEW TECHNIQUE FOR OBTAINING CRYSTALLOGRAPHIC INFORMATION IN SCANNING ELECTRON-MICROSCOPE

被引：349

作者：

VENABLES, JA ^{[1
]}

HARLAND, CJ ^{[1
]}

机构：

[1] UNIV SUSSEX,SCH MATH & PHYS SCI,BRIGHTON BN1 9QH,SUSSEX,ENGLAND

来源：

PHILOSOPHICAL MAGAZINE | 1973年 / 27卷 / 05期

关键词：

D O I：

10.1080/14786437308225827

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1193 / 1200

页数：8

共 11 条

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[3] SOME EXPERIMENTS USING KOSSEL LINES TO STUDY MAGNETIC DOMAIN-STRUCTURE IN POLYCRYSTALLINE COBALT
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[7] SIMULTANEOUS DISPLAY OF MICROGRAPH AND SELECTED-AREA CHANNELLING PATTERN USING SCANNING ELECTRON MICROSCOPE
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[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (11): : 837 - &
[8] JOY DC, 1971, SCANNING ELECTRON MI
[9] OPTIMUM CONDITIONS FOR GENERATING CHANNELLING PATTERNS IN SCANNING ELECTRON MICROSCOPE
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[10] van Essen C G, 1970, Nature, V225, P847, DOI 10.1038/225847a0