Atomic force microscopy of rubbed polyimide aligning films for liquid crystal displays

被引：9

作者：

Kim, YB ^{[1
]}

Kim, HS ^{[1
]}

Choi, JS ^{[1
]}

Matuszczyk, M ^{[1
]}

Olin, H ^{[1
]}

Buivydas, M ^{[1
]}

Rudquist, P ^{[1
]}

机构：

[1] CHALMERS UNIV TECHNOL, DEPT PHYS, S-41296 GOTHENBURG, SWEDEN

来源：

MOLECULAR CRYSTALS AND LIQUID CRYSTALS SCIENCE AND TECHNOLOGY SECTION A-MOLECULAR CRYSTALS AND LIQUID CRYSTALS | 1995年 / 262卷

关键词：

D O I：

10.1080/10587259508033515

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

The surface of polyimide (PI) films for aligning liquid crystals were studied by means of atomic force microscopy (AFM). The surface of the unrubbed PI films consisted of polymer clusters of different sizes which are randomly distributed over the film area. After rubbing, however, these polymer clusters formed long chains along the rubbing direction. The cluster chains were separated with periodicity about 100 nm for weak rubbing strength. Deeper grooves are also present, separated with periodicity about 2 mu m that could be related to the microstructure of the fibres from the rubbing cloth. On increasing the rubbing strength further on, the cluster chains coalesce into wider ones. The rubbed PI films show optical retardation, which was increased rapidly with increased the rubbing strength and reached a constant value of about 1.4nm.

引用

页码：89 / 98

页数：10

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