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INTERPRETATION OF DIFFERENTIAL ANOMALOUS X-RAY-SCATTERING DATA FOR AMORPHOUS CD-AS

被引：1
作者：
BURIAN, A
LECANTE, P
MOSSET, A
GALY, J
TONNERRE, JM
RAOUX, D
机构：
[1] CEMES,LOE,CNRS,F-31055 TOULOUSE,FRANCE
[2] LAB CRISTALLOG GRENOBLE,CNRS,UPR 503,F-38042 GRENOBLE,FRANCE
来源：
ACTA PHYSICA POLONICA A | 1994年 / 86卷 / 04期
关键词：
D O I：
10.12693/APhysPolA.86.633
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The computational procedure, based on Warren's exact method for an amorphous sample with more than one atom, was developed to obtain the short-range order structural parameters from the differential anomalous X-ray scattering data, collected using the synchrotron radiation. The experimental differential radial distribution functions were fitted with the true distribution functions expressed in an analytical form and broadened by convolution with the pair functions. It was found that atoms in the amorphous Cd-As films remain almost tetrahedrally coordinated and the investigated alloys are chemically ordered.
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页码：633 / 640
页数：8
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