THE INFLUENCE OF QUANTIZATION ON THE SPACE-CHARGE LAYER CAPACITANCE OF SI IN STRONG ACCUMULATION

被引:5
作者
FRANTSUZOV, AA
OKHONIN, SA
POGOSOV, AG
机构
[1] Acad of Sciences of the USSR, Novosibirsk, USSR, Acad of Sciences of the USSR, Novosibirsk, USSR
来源
PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 1986年 / 136卷 / 01期
关键词
D O I
10.1002/pssb.2221360127
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
SEMICONDUCTING SILICON
引用
收藏
页码:241 / 249
页数:9
相关论文
共 14 条
  • [1] ABRAMOVITS M, 1979, HDB MATH FUNCTIONS, pCH6
  • [2] BANGERT E, 1974, 12TH P INT C PHYS SE, P101
  • [3] EFFECT OF ELECTRIC AND MAGNETIC-FIELD ON SELF-CONSISTENT POTENTIAL AT SURFACE OF A DEGENERATE SEMICONDUCTOR
    BARAFF, GA
    APPELBAUM, JA
    [J]. PHYSICAL REVIEW B-SOLID STATE, 1972, 5 (02): : 475 - +
  • [4] FRANTSUZOV AA, 1984, 8TH P M PHYS SURF 2, P113
  • [5] Goetzberger A., 1976, Critical Reviews in Solid State Sciences, V6, P1, DOI 10.1080/10408437608243548
  • [6] HARDALOV CM, 1984, SURFACE SCI, V147, P355
  • [7] JAYADEVAIAH TS, 1974, SURFACE SCI RECENT P, pCH19
  • [8] Many A., 1965, SEMICONDUCTOR SURFAC
  • [9] SATURATION CAPACITANCE OF THIN OXIDE MOS STRUCTURES AND EFFECTIVE SURFACE DENSITY OF STATES OF SILICON
    MASERJIA.J
    PETERSSO.G
    SVENSSON, C
    [J]. SOLID-STATE ELECTRONICS, 1974, 17 (04) : 335 - 339
  • [10] NICOLLIAN EH, 1982, MOS PHYSICS TECHNOLO, V9, P96