X-RAY SECONDARY FLUORESCENCE IN MATRIX CORRECTION

被引：9

作者：

PLESCH, R

机构：

[1] Siemens AG, Karlsruhe, D-7500

来源：

X-RAY SPECTROMETRY | 1979年 / 8卷 / 03期

关键词：

D O I：

10.1002/xrs.1300080307

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Rasberry and Heinrich1 have proposed a mathematical statement for the correction of secondary excitation based on experimental observation. It will be shown that the mathematical form of this statement can also be confirmed physically. With regard to the coefficients, suggestions will be made which should provide a greater, general validity of the statement. Finally, the statement will also be extended to analytical problems in which the intensity of the matrix elements will be used for matrix correction, instead of their concentrations. Copyright © 1979 Heyden & Son Ltd.

引用

页码：114 / 116

页数：3