NOVEL TECHNIQUE FOR MEASURING Q FACTOR OF THIN-FILM LUMPED ELEMENTS AT MICROWAVE FREQUENCIES

被引：4

作者：

HUGHES, JJ

NAPOLI, LS

REICHERT, WF

机构：

[1] RCA Laboratories David Sarnoff Research Centre Princeton

来源：

ELECTRONICS LETTERS | 1969年 / 5卷 / 21期

关键词：

D O I：

10.1049/el:19690401

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Using higher-order resonances, it is possible to determine the Q factors of thin-film lumped elements at microwave frequencies. This technique avoids any perturbation of the experimental arrangement which normally arises from insertion and removal of the unknown. © 1969, The Institution of Electrical Engineers. All rights reserved.

引用

页码：535 / &