C-TESTABILITY OF TWO-DIMENSIONAL ITERATIVE ARRAYS

被引：57

作者：

ELHUNI, H ^{[1
]}

VERGIS, A ^{[1
]}

KINNEY, L ^{[1
]}

机构：

[1] UNIV MINNESOTA,DEPT COMP SCI,MINNEAPOLIS,MN 55455

来源：

关键词：

D O I：

10.1109/TCAD.1986.1270228

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：573 / 581

页数：9

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[2]

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[3]

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[4]

Friedman A.D., 1971, FAULT DETECTION DIGI

[5] EASILY TESTABLE ITERATIVE SYSTEMS [J].

FRIEDMAN, AD .

[6]

Hwang K., 1984, COMPUTER ARCHITECTUR

[7]

KAUTZ WH, 1967, 8TH P S SWITCH AUT T, P161

[8]

KUNG HT, 1982, COMPUTER, V15, P37, DOI 10.1109/MC.1982.1653825

[9]

Mead C., 1980, INTRO VLSI SYSTEMS

[10]

PARTHASARATHY R, 1981, IEEE T COMPUT, V30, P833, DOI 10.1109/TC.1981.1675714