ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY

被引：307

作者：

ALBRECHT, TR

QUATE, CF

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1987年 / 62卷 / 07期

关键词：

D O I：

10.1063/1.339435

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2599 / 2602

页数：4

共 22 条

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