COMA-FREE ALIGNMENT OF HIGH-RESOLUTION ELECTRON-MICROSCOPES WITH AID OF OPTICAL DIFFRACTOGRAMS

被引：216

作者：

ZEMLIN, F

WEISS, K

SCHISKE, P

KUNATH, W

HERRMANN, KH

机构：

来源：

关键词：

D O I：

10.1016/S0304-3991(78)80006-0

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：49 / 60

页数：12

共 28 条

[1]

FRANK J, 1973, OPTIK, V38, P519

[2]

FRANK J, 1969, OPTIK, V30, P171

[3]

FRANK J, 1970, BERICH BUNSEN GESELL, V74, P1105

[4] THE ELECTRON OPTICAL SYSTEM OF THE ELECTRON MICROSCOPE [J].

HAINE, ME .

JOURNAL OF SCIENTIFIC INSTRUMENTS, 1947, 24 (03) :61-66

[5]

HANSSEN KJ, 1971, OPTIK, V32, P519

[6]

HANSSEN KJ, 1976, MIKROSKOPIE, V32, P254

[7]

HANSSEN KJ, 1976, PTBAPH10 PHYS TECHN

[8]

Hanszen K. J., 1971, ADV OPTICAL ELECT MI, VIV, P1

[9]

HERRMAN KH, 1976, MIKROSCOPIE, V32, P235

[10]

HERRMANN KH, 1976, OPTIK, V44, P393