COMPUTER EXPERIMENTS FOR QUALITY-CONTROL BY PARAMETER DESIGN

被引：201

作者：

WELCH, WJ

YU, TK

KANG, SM

SACKS, J

机构：

[1] UNIV WATERLOO,INST IMPROVEMENT QUAL & PRODUCTIV,WATERLOO N2L 3G1,ONTARIO,CANADA

[2] UNIV ILLINOIS,DEPT ELECT & COMP ENGN,URBANA,IL 61801

[3] UNIV ILLINOIS,PHYS THERAPY LAB,URBANA,IL 61801

来源：

JOURNAL OF QUALITY TECHNOLOGY | 1990年 / 22卷 / 01期

关键词：

D O I：

10.1080/00224065.1990.11979201

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：15 / 22

页数：8

共 11 条

[1] OFF-LINE QUALITY-CONTROL, PARAMETER DESIGN, AND THE TAGUCHI METHOD - DISCUSSION [J].

EASTERLING, RG .

JOURNAL OF QUALITY TECHNOLOGY, 1985, 17 (04) :191-192

[2] ROBUST DESIGN - A COST-EFFECTIVE METHOD FOR IMPROVING MANUFACTURING PROCESSES [J].

KACKAR, RN ;

SHOEMAKER, AC .

AT&T TECHNICAL JOURNAL, 1986, 65 (02) :39-50

[3]

KACKAR RN, 1985, J QUAL TECHNOL, V17, P176, DOI 10.1080/00224065.1985.11978964

[4] PERFORMANCE-MEASURES INDEPENDENT OF ADJUSTMENT - AN EXPLANATION AND EXTENSION OF TAGUCHIS SIGNAL-TO-NOISE RATIOS [J].

LEON, RV ;

SHOEMAKER, AC ;

KACKER, RN .

TECHNOMETRICS, 1987, 29 (03) :253-265

[5] DESIGN OPTIMIZATION CASE-STUDIES [J].

PHADKE, MS .

AT&T TECHNICAL JOURNAL, 1986, 65 (02) :51-68

[6] DESIGNS FOR COMPUTER EXPERIMENTS [J].

SACKS, J ;

SCHILLER, SB ;

WELCH, WJ .

TECHNOMETRICS, 1989, 31 (01) :41-47

[7] ELIMINATION OF PROCESS-DEPENDENT CLOCK SKEW IN CMOS VLSI [J].

SHOJI, M .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1986, 21 (05) :875-880

[8]

Taguchi G., 1979, INTRO OFF LINE QUALI

[9]

Taguchi G, 1986, INTRO QUALITY ENG DE

[10]

Welch W.J., 1985, AM STAT, V39, P146, DOI [10.2307/2682827, DOI 10.2307/2682827]

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