LARGE APERTURE AC INTERFEROMETER FOR OPTICAL TESTING

被引：16

作者：

MOORE, DT

MURRAY, R

NEVES, FB

机构：

[1] ITEK CORP, LEXINGTON, MA 02173 USA

[2] TEXAS INSTRUMENTS INC, DIV ELECTRO OPT, DALLAS, TX 75222 USA

来源：

APPLIED OPTICS | 1978年 / 17卷 / 24期

关键词：

D O I：

10.1364/AO.17.003959

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：3959 / 3963

页数：5

共 11 条

[1]

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HERRIOTT, DR ;

GALLAGHER, JE ;

ROSENFELD, DP ;

WHITE, AD ;

BRANGACCIO, DJ .

APPLIED OPTICS, 1974, 13 (11) :2693-2703

[3]

CRANE R, 1969, APPL OPTICS, V8, P538

[4]

GATES JW, 1960, OPTICS METROLOGY, P201

[5] EVALUATION OF EXPANDED LASER-BEAMS USING AN OPTICAL FLAT [J].

LURIE, M .

OPTICAL ENGINEERING, 1976, 15 (01) :68-69

[6] BIBLIOGRAPHY OF VARIOUS OPTICAL TESTING METHODS [J].

MALACARA, D ;

CORNEJO, A ;

MURTY, MVRK .

APPLIED OPTICS, 1975, 14 (05) :1065-1080

[7]

MOORE DT, 1974, THESIS U ROCHESTER

[8] USE OF SINGLE PLANE PARALLEL PLATE AS LATERAL SHEARING INTERFEROMETER WITH VISIBLE GAS LASER SOURCE [J].

MURTY, MVR .

APPLIED OPTICS, 1964, 3 (04) :531-&

[9]

PEASON JE, 1976, APPL OPTICS, V15, P611

[10] UP-DOWN FREQUENCY SHIFTER FOR OPTICAL HETERODYNE INTERFEROMETRY [J].

SOMMARGREN, GE .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1975, 65 (08) :960-961

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