THE MEASUREMENT AND CORRECTION OF INTENSITIES FROM SINGLE-CRYSTAL X-RAY PHOTOGRAPHS

被引：29

作者：

KAAN, G

COLE, WF

机构：

来源：

ACTA CRYSTALLOGRAPHICA | 1949年 / 2卷 / 01期

关键词：

D O I：

10.1107/S0365110X49000096

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：38 / 43

页数：6

相关论文

共 11 条

[1] [Anonymous], 1942, XRAY CRYSTALLOGRAPHY
[2] CORRECTION OF X-RAY DIFFRACTION INTENSITIES FOR LORENTZ AND POLARIZATION FACTORS
BUERGER, MJ
KLEIN, GE
[J]. JOURNAL OF APPLIED PHYSICS, 1945, 16 (07) : 408 - 418
[3] THE CORRECTION OF X-RAY INTENSITIES FOR POLARIZATION AND LORENTZ FACTORS
COCHRAN, W
[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS AND OF PHYSICS IN INDUSTRY, 1948, 25 (07): : 253 - 254
[4] Correction factors in the photographic measurement of X-ray intensities in crystal analysis
Cox, EG
Shaw, WFB
[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-CONTAINING PAPERS OF A MATHEMATICAL AND PHYSICAL CHARACTER, 1930, 127 (804) : 71 - 88
[5] DAWTON RH, 1938, P PHYS SOC LONDON, V50, P419
[6] DAWTON RHV, 1937, J SCI INSTRUM, V14, P198
[7] Reciprocal Lorentz-polarization factor charts for equi-inclination Weissenberg photographs
Lu, CS
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1943, 14 (11) : 331 - 335
[8] ROBERTSON JM, 1941, J SCI INSTRUM, V18, P126
[9] ROBINSON BW, 1933, J SCI INSTRUM, V10, P233
[10] WIEBENGA EH, 1947, RECL TRAV CHIM PAY B, V66, P746