AN X-RAY METHOD FOR DETERMINING TIN COATING THICKNESS ON STEEL

被引:20
作者
BEEGHLY, HF
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D O I
10.1149/1.2777982
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
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页码:152 / 157
页数:6
相关论文
共 4 条
[1]   AN X-RAY METHOD FOR MEASURING THE THICKNESS OF THIN CRYSTALLINE FILMS [J].
EISENSTEIN, A .
JOURNAL OF APPLIED PHYSICS, 1946, 17 (11) :874-878
[2]   THICKNESS MEASUREMENT OF THIN COATINGS BY X-RAY ABSORPTION [J].
FRIEDMAN, H ;
BIRKS, LS .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1946, 17 (03) :99-101
[3]  
GRAY RB, 1946, PHYS REV, V69, P49
[4]  
MCKENZIE HA, 1946, J SOC CHEM IND LONDO, V66, P312