THE IBM COMPUTER - STEM SYSTEM

[1] DIGITAL DATA ACQUISITION OF ELECTRON-ENERGY LOSS INTENSITIES [J]. ULTRAMICROSCOPY, 1978, 3 (04) : 367 - 371

[2] BATSON PE, 1971, 29TH P ANN M EL MICR, P30

[3] BATSON PE, 1978, 9TH P INT C EL MICR, V1, P562

[4] SLOW SCAN DISPLAY SYSTEM FOR A SCANNING ELECTRON-MICROSCOPE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (08) : 1064 - 1066

[5] EGERTON RF, 1980, 38TH ANN P EMSA, P130

[6] SCANNING ELECTRON-DIFFRACTION STUDY OF VAPOR-DEPOSITED AND ION-IMPLANTED THIN-FILMS OF GE (I) [J]. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1973, 58 (01): : 163 - 179

[7] JONES AV, 1980, SCANNING ELECTRON MI, V1, P113

[1] DIGITAL DATA ACQUISITION OF ELECTRON-ENERGY LOSS INTENSITIES [J]. ULTRAMICROSCOPY, 1978, 3 (04) : 367 - 371

[2] BATSON PE, 1971, 29TH P ANN M EL MICR, P30

[3] BATSON PE, 1978, 9TH P INT C EL MICR, V1, P562

[4] SLOW SCAN DISPLAY SYSTEM FOR A SCANNING ELECTRON-MICROSCOPE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (08) : 1064 - 1066

[5] EGERTON RF, 1980, 38TH ANN P EMSA, P130

[6] SCANNING ELECTRON-DIFFRACTION STUDY OF VAPOR-DEPOSITED AND ION-IMPLANTED THIN-FILMS OF GE (I) [J]. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1973, 58 (01): : 163 - 179

[7] JONES AV, 1980, SCANNING ELECTRON MI, V1, P113