DOUBLE-SIDED SILICON MICROSTRIP DETECTORS AND LOW-NOISE SELF-TRIGGERING MULTICHANNEL READOUT CHIPS FOR IMAGING APPLICATIONS

被引：9

作者：

RONNQVIST, C

SANTOS, F

TOKER, O

WEILHAMMER, P

YOSHIOKA, K

NYGARD, E

CZERMAK, A

JALOCHA, P

DULINSKI, W

HU, Y

机构：

[1] FED UNIV RIO DE JANEIRO,RIO JANEIRO,BRAZIL

[2] IFJ,KRAKOW,POLAND

[3] LEPSI,STRASBOURG,FRANCE

[4] CERN,CH-1211 GENEVA 23,SWITZERLAND

[5] UNIV OSLO,OSLO 3,NORWAY

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1994年 / 348卷 / 2-3期

关键词：

CMOS integrated circuits - Diodes - Electronic equipment - High energy physics - Imaging techniques - Microstrip devices - Particle beams - Readout systems - X rays;

D O I：

10.1016/0168-9002(94)90776-5

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Double-sided silicon microstrip detectors and CMOS low noise self-triggering 16-channel chips have successfully been tested with low energy X-rays and beta-emitting sources for imaging of simple patterns. The noise slope of the chip is measured to 19.2 e-/pF. Also a 2 x 2 mm2 diode has been used to measure the photon energy resolution in the range of 8-60 keV. With the diode the K-line from Cu (8.04 keV) is clearly visible. Two-dimensional images are shown.

引用

页码：440 / 443

页数：4