DETERMINATION OF RELEVANT SIZE PARAMETERS FOR SONICATED AND UNSONICATED NANOCRYSTALLINE GAAS PARTICLES

被引：8

作者：

HAGAN, CRS ^{[1
]}

KHER, SS ^{[1
]}

HALAOUI, LI ^{[1
]}

WELLS, RL ^{[1
]}

COURY, LA ^{[1
]}

机构：

[1] DUKE UNIV,DEPT CHEM,DURHAM,NC 27708

来源：

ANALYTICAL CHEMISTRY | 1995年 / 67卷 / 03期

关键词：

D O I：

10.1021/ac00099a008

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Nanocrystalline GaAs was characterized using X-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM), multipoint Brunauer-Emmett-Teller (BET) surface area analysis, scanning tunneling microscopy (STM), scanning electron microscopy (SEM), and UV/vis spectrophotometry, Each of these techniques was evaluated for the determination of particle size, Comparable results were obtained from XRD, HRTEM, BET, and STM. UV/vis absorption thresholds were consistent with quantum confinement effects, but the magnitude of the blue shift in the absorption edge was greater than expected for particles of this size, Exposure of the particles to high-intensity, 20-kHz ultrasound resulted in deaggregation of particles without significantly affecting the crystalline regions responsible for quantum confinement.

引用

页码：528 / 534

页数：7

共 29 条

[1] ANALYTICAL-CHEMISTRY AND SEMICONDUCTOR-MATERIALS [J].