TSEE RESPONSE OF SPUTTERED MGO FILMS TO LOW-ENERGY X-RAY DOSES

MgO films doped with various elements have been prepared by means of Ar rf-sputtering and the response of thermally stimulated exoelectron emission (TSEE) to a soft X-ray dose has been measured using a GM counter of the gas flow type. The films doped with 0.1% of KCl or Al2O3 seem to be promising for dosimetry use, showing a sensitivity to X-rays below 2 keV at an exposure level of 0.3 R. To estimate the level, the X-ray energy dependence of the TSEE response is studied and compared with that of typical TL dosimeters. © 1990 The Japan Society of Applied Physics.