TRACE-ELEMENT ANALYSIS IN THICK ORGANIC SPECIMENS BY PHOTON EXCITED X-RAY-FLUORESCENCE

被引：11

作者：

ALENIUS, G ^{[1
]}

RIEDL, H ^{[1
]}

RINDBY, A ^{[1
]}

SELIN, E ^{[1
]}

STANDZENIEKS, P ^{[1
]}

机构：

[1] CHALMERS TECHN UNIV,DEPT PHYS,S-40220 GOTHENBURG,SWEDEN

来源：

PHYSICA SCRIPTA | 1977年 / 15卷 / 04期

关键词：

D O I：

10.1088/0031-8949/15/4/002

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：220 / 224

页数：5

共 17 条

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[9] SOME ASPECTS OF X-RAY-FLUORESCENCE SPECTROMETERS FOR TRACE-ELEMENT ANALYSIS [J].

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