ELECTRON-MICROSCOPY OF MATERIALS MODIFICATION INDUCED BY TOKAMAK PLASMA

被引：7

作者：

TOKUNAGA, K ^{[1
]}

MUROGA, T ^{[1
]}

MIYAMOTO, Y ^{[1
]}

FUJIWARA, T ^{[1
]}

YOSHIDA, N ^{[1
]}

NAKAMURA, K ^{[1
]}

HIRAKI, N ^{[1
]}

ITOH, S ^{[1
]}

机构：

[1] KYUSHU UNIV,APPL MECH RES INST,KASUGA,FUKUOKA 816,JAPAN

来源：

JOURNAL OF NUCLEAR MATERIALS | 1991年 / 179卷

关键词：

D O I：

10.1016/0022-3115(91)90099-S

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In order to investigate fundamental processes of plasma-wall interactions of tokamak devices, specimens for Transmission Electron Microscope (TEM) observation were exposed to plasma of High-Field Tokamak TRIAM-1. TEM or SEM observation showed an initial process of droplet ejection from molten surfaces and low energy hydrogen-induced microstructures. Mechanisms of the damage processes observed and their implication to wall/limiter performance were discussed.

引用

页码：356 / 359

页数：4

共 16 条

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