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CONVERSION FROM AN ENERGY SCALE TO A DEPTH SCALE IN CHANNELING EXPERIMENTS
被引:27
作者
:
BOTTIGER, J
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT,SCI CTR,THOUSAND OAKS,CA 91360
ROCKWELL INT,SCI CTR,THOUSAND OAKS,CA 91360
BOTTIGER, J
[
1
]
EISEN, FH
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT,SCI CTR,THOUSAND OAKS,CA 91360
ROCKWELL INT,SCI CTR,THOUSAND OAKS,CA 91360
EISEN, FH
[
1
]
机构
:
[1]
ROCKWELL INT,SCI CTR,THOUSAND OAKS,CA 91360
来源
:
THIN SOLID FILMS
|
1973年
/ 19卷
/ 02期
关键词
:
D O I
:
10.1016/0040-6090(73)90059-X
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:239 / 246
页数:8
相关论文
共 5 条
[1]
DEFECT STUDIES IN CRYSTALS BY MEANS OF CHANNELING
BOGH, E
论文数:
0
引用数:
0
h-index:
0
BOGH, E
[J].
CANADIAN JOURNAL OF PHYSICS,
1968,
46
(06)
: 653
-
&
[2]
EDGE RD, 1970, ATOMIC COLLISION PHE
[3]
Eisen F.H., 1972, RADIAT EFF, V13, P93, DOI [10.1080/00337577208231165, DOI 10.1080/00337577208231165]
[4]
CHANNELING OF MEDIUM-MASS IONS THROUGH SILICON
EISEN, FH
论文数:
0
引用数:
0
h-index:
0
EISEN, FH
[J].
CANADIAN JOURNAL OF PHYSICS,
1968,
46
(06)
: 561
-
&
[5]
EISEN FH, TO BE PUBLISHED
←
1
→
共 5 条
[1]
DEFECT STUDIES IN CRYSTALS BY MEANS OF CHANNELING
BOGH, E
论文数:
0
引用数:
0
h-index:
0
BOGH, E
[J].
CANADIAN JOURNAL OF PHYSICS,
1968,
46
(06)
: 653
-
&
[2]
EDGE RD, 1970, ATOMIC COLLISION PHE
[3]
Eisen F.H., 1972, RADIAT EFF, V13, P93, DOI [10.1080/00337577208231165, DOI 10.1080/00337577208231165]
[4]
CHANNELING OF MEDIUM-MASS IONS THROUGH SILICON
EISEN, FH
论文数:
0
引用数:
0
h-index:
0
EISEN, FH
[J].
CANADIAN JOURNAL OF PHYSICS,
1968,
46
(06)
: 561
-
&
[5]
EISEN FH, TO BE PUBLISHED
←
1
→