ELECTROOPTIC HOLOGRAPHY SYSTEM FOR VIBRATION ANALYSIS AND NONDESTRUCTIVE TESTING

被引：23

作者：

STETSON, KA

BROHINSKY, WR

机构：

[1] United Technologies Research Cent,, East Hartford, CT, USA, United Technologies Research Cent, East Hartford, CT, USA

来源：

关键词：

D O I：

10.1117/12.7977161

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1234 / 1239

页数：6

共 9 条

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[4]

EK L, 1985, P SOC PHOTO-OPT INST, V523, P155, DOI 10.1117/12.946280

[5]

ENNOS AE, 1978, PROGR OPTICS, V16, P238

[6]

JONES R, 1983, HOLOGRAPHIC SPECKLE, pCH4

[7]

Lokberg O. J., 1987, Proceedings of the SPIE - The International Society for Optical Engineering, V746, P86, DOI 10.1117/12.939769

MACOVSKI, A ;

RAMSEY, SD ;

SCHAEFER, LF .

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STETSON, KA ;

BROHINSKY, WR .

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