EXCITATION ENERGIES AND LIFETIMES OF LEVELS IN 26SI

Measurements of excitation energies, lifetimes, and decay modes in 26Si are described. The 24Mg(3He,n)26Si reaction was used. The following energies and lifetimes were determined: 1795.9±0.2 keV (τ=1.4-0.5+0.7ps); 2783.5±0.4 keV (τ=0.20-0.12+0.20ps); 3332.5±0.3 keV (τ=2.7-1.0+2.3ps); 3756±2 keV (τ<0.7 ps); 3842±2 keV; 4093±3 keV; 4138±1 keV (τ=0.11-0.10+0.11ps); 4445±3 keV (τ<0.5 ps); and 4805±2 keV (τ<0.1 ps). These results are compared to shell-model calculations. © 1969.