PROJECTILE-CHARGE-STATE DEPENDENCE OF TARGET L-SHELL IONIZATION BY 1.86-MEV-AMU FLUORINE AND SILICON IONS AND 1.8-MEV-AMU CHLORINE IONS

L x-ray-production cross sections have been measured for solid targets of Nd60, Ho67, and Au79 for 1.86-MeV/amu F919 and Si1428, and 1.8-MeV/amu Cl1735 ions as a function of the incident charge state. From the projectile-charge- state dependence of the cross sections, both direct-ionization and electron-capture contributions were extracted for a comparison to Coulomb ionization theories. The data provide supporting evidence for the theory of electron capture with a reduced binding effect. With standard fluorescence and Coster-Kronig yields uncorrected for multiple-ionization effects, the direct ionization theories did not simultaneously reproduce the projectile-Z1 and target-Z2 dependences of the data. © 1979 The American Physical Society.