A QUALITATIVE ELLIPSOMETRIC-ELECTROCHEMICAL APPROACH TO THE STUDY OF FILM GROWTH UNDER ORGANIC COATINGS

被引：30

作者：

RITTER, JJ

KRUGER, J

机构：

来源：

关键词：

D O I：

10.1016/0039-6028(80)90314-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：364 / 374

页数：11

共 6 条

[1] AMBROSE JR, 1971, CORROSION, V28, P30
[2] QUALITATIVE USE OF ELLIPSOMETRY TO STUDY LOCALIZED CORROSION PROCESSES
KRUGER, J
AMBROSE, JR
[J]. SURFACE SCIENCE, 1976, 56 (01) : 394 - 412
[3] LEIDHEISER H, 1979, CORROSION CONTROL CO
[4] MCCRACKIN FL, 1969, NBS479 TECH NOT
[5] MELMED AJ, UNPUBLISHED
[6] NEW RESONANT ELLIPSOMETRIC TECHNIQUE FOR CHARACTERIZING THE INTERFACE BETWEEN GAAS AND ITS PLASMA-GROWN OXIDE
THEETEN, JB
ASPNES, DE
CHANG, RPH
[J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (12) : 6097 - 6102